Nihar Ranjan Mohapatra
Department : Electrical Engineering
Research Interests
● Nano-scale devices physics
● Device and circuit interaction in advanced devices
● Reliability of semiconductor devices
● Compact modeling
● Computational lithography
● Analog IC design
Professional Summary
Professor, Indian Institute of Technology, Gandhinagar, (Feb 2020 – Present)
Associate Professor, Indian Institute of Technology, Gandhinagar, (Nov 2015 – Feb 2020)
Assistant Professor, Indian Institute of Technology, Gandhinagar, (July 2011 – Nov 2015)
Member of Technical Staff, GLOBALFOUNDRIES, Dresden, Germany (Feb 2009 – Jun 2011 )
Sr. Technology and Integration Engineer, Advanced Micro Devices (AMD), Dresden, Germany (Oct 2006 – Jan 2009)
Member of Scientific Staff, IHP Microelectronics, Frankfurt (Oder), Germany (Jul 2003 – Sep 2006)
Graduate Engineer, Larsen and Tubro Ltd, Chennai, India (July 1998 – May 1999)
Publications
1. Mohit D. Ganeriwala, Francisco G. Ruiz, Enrique G. Marin, Nihar R. Mohapatra, “A Compact model for the III-V Nanowire electrostatics including band non-parabolicty”, Journal of Computational Electronics, Accepted.
2. Apoorva Ojha and Nihar R. Mohapatra, “A computationally efficient quantum-corrected Poisson solver for accurate device simulation of multi-gate FETs”, Solid State Electronics, Vol. 160, October 2019.
3. Sangya Dutta, Tanmay Chavan, Nihar R. Mohapatra and Udayan Ganguly, “Electrical Tunability of Partially Depleted Silicon on Insulator (PD-SOI) Neuron”, Solid State Electronics, Vol. 160, October 2019.
4. Rohit Dawar, Samit Barai, Pardeep Kumar, Babji Srinivasan and Nihar R. Mohapatra, “Random forest based robust classification for lithographic hotspot detection”, Journal of Micro/Nanolithography, MEMS, and MOEMS, Apr. 2019.
5. Mohit D. Ganeriwala, Francisco G. Ruiz, Enrique G. Marin, Nihar R. Mohapatra, A Compact Charge and Surface Potential Model for III-V Cylindrical Nanowire Transistors, IEEE Transaction on Electro Devices (IEEE TED), Vol. 66, Issue 1, pp. 73, 2019.
6. Mandar Bhoir, Yogesh Singh Chauhan and Nihar R. Mohapatra, Back-gate Bias and Substrate Doping influenced Substrate Effect in UTBB FD-SOI MOS Transistors: Analysis and Optimization Guidelines, IEEE Transaction on Electro Devices (IEEE TED), Vol. 66, Issue 2, pp. 861, 2019.
Complete List of Publications